Failure rate data for ALSEP
Failure rate data for ALSEP
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Date
1970
Authors
Howell, F. L.
Journal Title
Journal ISSN
Volume Title
Publisher
Bendix Aerospace Systems Division
Abstract
This ATM now includes failure rate data on Unitrode and Isofilm diodes and TTL integrated circuits. Also, the integrated circuit failure rate is now a function of temperature. A lunar standby K factor has been added and minor changes have been made to all failure rate charts. Appendix A, Reliability Mathematics and Methods has also been added.