Reliability overvoltage tests of Fairchild integrated operational amplifier circuits

dc.contributor.author	Andreasen, K. D.
dc.date.accessioned	2015-09-09T22:27:13Z
dc.date.available	2015-09-09T22:27:13Z
dc.date.issued	1968
dc.description.abstract	The purpose of this report is to document the results of special tests performed by Bendix Aerospace Division on randomly selected samples of Fairchild integrated operational amplifier circuits to determine if damage can occur to these products due to over-voltage conditions like those experienced by the ALSEP Flight 2 equipments.
dc.description.statementofresponsibility	prepared by K. D. Andreasen.
dc.format.extent	9 leaves
dc.format.mimetype	application/pdf
dc.identifier.other	31111000666881
dc.identifier.uri	https://hdl.handle.net/20.500.11753/204
dc.language.iso	en
dc.publisher	Bendix Aerospace Systems Division
dc.relation.ispartofseries	ALSEP technical memorandum
dc.source.uri	https://www.lpi.usra.edu/lunar/ALSEP/pdf/ALSEP%20%23290%20-%20Reli%20Overvoltage%20Tests_Fairchild%20IntegOpAmpCircuits_ATM%20801.pdf
dc.subject.lcc	TL789.8.U6A5
dc.subject.lcsh	Apollo Lunar Surface Experiments Package
dc.subject.lcsh	Overvoltage
dc.subject.lcsh	Integrated circuits
dc.title	Reliability overvoltage tests of Fairchild integrated operational amplifier circuits

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Name:: ALSEP #290 - Reli Overvoltage Tests_Fairchild IntegOpAmpCircuits_ATM 801.pdf
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