Reliability overvoltage tests of Fairchild integrated operational amplifier circuits
Reliability overvoltage tests of Fairchild integrated operational amplifier circuits
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Date
1968
Authors
Andreasen, K. D.
Journal Title
Journal ISSN
Volume Title
Publisher
Bendix Aerospace Systems Division
Abstract
The purpose of this report is to document the results of special tests performed by Bendix Aerospace Division on randomly selected samples of Fairchild integrated operational amplifier circuits to determine if damage can occur to these products due to over-voltage conditions like those experienced by the ALSEP Flight 2 equipments.