Test report for ML323-3 S/N 5 diagnostic testing.
Test report for ML323-3 S/N 5 diagnostic testing.
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Date
1968
Authors
Marshall Laboratories
Journal Title
Journal ISSN
Volume Title
Publisher
Marshall Laboratories?
Abstract
This report covers all testing accomplished to isolate the Cold Cathode Ion Gage (CCIG), part of the Cold Cathode Gage Experiment (CCGE) high voltage malfunction noted at Bendix Aerospace during thermal vacuum testing.