ALSEP Array E parts application analysis signal conditioning circuits
ALSEP Array E parts application analysis signal conditioning circuits
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Date
1971
Authors
Smith, John G.
Journal Title
Journal ISSN
Volume Title
Publisher
Bendix Aerospace Systems Division
Abstract
The purpose of ATM 998 is to document the results of the Parts Application Analysis study conducted on the Signal Conditioning Circuits. The Signal Conditioning Circuits are located in Digital Data Processor Module. The circuits condition the T/M temperature sensor signals and T/M voltage monitor signals.