LSG parts application analysis
LSG parts application analysis
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Date
1971
Authors
Van Hoorde, G. R.
Journal Title
Journal ISSN
Volume Title
Publisher
Bendix Aerospace Systems Division
Abstract
The purpose of this ATM is to document the results of the Parts Application Analysis study performed on the LSG Experiment. The stress levels shown were determined on the basis of electronic piece parts operating at the worst case values of resistance, capacitance, etc., and worst case application of voltage and current levels. This ATM, Revision A, reflects the PAA results of the LSG "High Data Rate Model".