RSST failure mode, effects, and criticality analysis

dc.contributor.author	Moskowitz, Lee S.
dc.date.accessioned	2015-09-09T22:27:30Z
dc.date.available	2015-09-09T22:27:30Z
dc.date.issued	1970
dc.description.abstract	The major change between this document and corresponding documents as released by Gulton is the basic failure rate used in this ATM for the RCA CD4000 family of COS/MOS Fets. Bendix Reliability arrived at a more realistic failure rate in view of test data received from RCA frdm two separate tests. The major effect that this change has upon all related documentation is that the COS/MOS counters now have the highest probability of failure of any part used in the RSST. This changes the criticality rankings of the parts covered by this document.
dc.description.statementofresponsibility	prepared by Lee Moskowitz.
dc.format.extent	27 leaves
dc.format.mimetype	application/pdf
dc.identifier.other	31111000668978
dc.identifier.uri	https://hdl.handle.net/20.500.11753/280
dc.language.iso	en
dc.publisher	Bendix Aerospace Systems Division
dc.relation.ispartofseries	ALSEP technical memorandum
dc.source.uri	https://www.lpi.usra.edu/lunar/ALSEP/pdf/31111000668978.pdf
dc.subject.lcc	TL789.8.U6A5
dc.subject.lcsh	Electric controllers
dc.subject.lcsh	Apollo Lunar Surface Experiments Package
dc.title	RSST failure mode, effects, and criticality analysis
dc.title.alternative	Resettable Solid State Timer failure mode, effects, and criticality analysis

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