RSST failure mode, effects, and criticality analysis
RSST failure mode, effects, and criticality analysis
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Date
1970
Authors
Moskowitz, Lee S.
Journal Title
Journal ISSN
Volume Title
Publisher
Bendix Aerospace Systems Division
Abstract
The major change between this document and corresponding documents as released by Gulton is the basic failure rate used in this ATM for the RCA CD4000 family of COS/MOS Fets. Bendix Reliability arrived at a more realistic failure rate in view of test data received from RCA frdm two separate tests. The major effect that this change has upon all related documentation is that the COS/MOS counters now have the highest probability of failure of any part used in the RSST. This changes the criticality rankings of the parts covered by this document.