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Test report for ML323-3 S/N 5 diagnostic testing.
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Test report for ML323-3 S/N 5 diagnostic testing.
Marshall Laboratories
URI:
https://hdl.handle.net/20.500.11753/607
Date:
1968
Abstract:
This report covers all testing accomplished to isolate the Cold Cathode Ion Gage (CCIG), part of the Cold Cathode Gage Experiment (CCGE) high voltage malfunction noted at Bendix Aerospace during thermal vacuum testing.
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