ALSEP Array E - signal conditioning circuits reliability and failure mode, effects and critical analysis

Smith, John G.

dc.contributor.author	Smith, John G.
dc.date.accessioned	2015-09-09T22:30:17Z
dc.date.available	2015-09-09T22:30:17Z
dc.date.issued	1971
dc.identifier.other	31111000670263
dc.identifier.uri	https://hdl.handle.net/20.500.11753/409
dc.description.abstract	This ATM documents the Failure Modes, Effects and Criticality Analysis on the Signal Conditioning Circuit. The analysis reflects analysis on those parts which are presently planned to be used in final flight configuration.
dc.description.statementofresponsibility	prepared by John G. Smith.
dc.format.extent	14 leaves
dc.format.mimetype	application/pdf
dc.language.iso	en
dc.publisher	Bendix Aerospace Systems Division
dc.relation.ispartofseries	ALSEP technical memorandum ; 999
dc.source.uri	https://www.lpi.usra.edu/lunar/ALSEP/pdf/31111000670263.pdf
dc.subject.lcc	TL789.8.U6A5
dc.subject.lcsh	Apollo Lunar Surface Experiments Package
dc.subject.lcsh	Electronic circuits
dc.title	ALSEP Array E - signal conditioning circuits reliability and failure mode, effects and critical analysis
dc.title.alternative	Apollo Lunar Surface Experiments Package Array E - signal conditioning circuits reliability and failure mode, effects and critical analysis