ALSEP Array E - Digital Data Processor reliability and failure model effects and critical analysis

Smith, John G.

dc.contributor.author	Smith, John G.
dc.date.accessioned	2015-09-09T22:30:11Z
dc.date.available	2015-09-09T22:30:11Z
dc.date.issued	1971
dc.identifier.other	31111000669844
dc.identifier.uri	https://hdl.handle.net/20.500.11753/367
dc.description.abstract	This ATM documents the Failure Modes, Effect and Criticality analysis on the Digital Data Processor. The analysis reflects analysis on those parts which are presently planned to be used in final flight configuration.
dc.description.statementofresponsibility	prepared by John G. Smith.
dc.format.extent	46 leaves
dc.format.mimetype	application/pdf
dc.language.iso	en
dc.publisher	Bendix Aerospace Systems Division
dc.relation.ispartofseries	ALSEP technical memorandum ; 950
dc.source.uri	https://www.lpi.usra.edu/lunar/ALSEP/pdf/31111000669844.pdf
dc.subject.lcc	TL789.8.U6A5
dc.subject.lcsh	Apollo Lunar Surface Experiments Package
dc.subject.lcsh	Automatic data collection systems
dc.subject.lcsh	Data transmission systems
dc.title	ALSEP Array E - Digital Data Processor reliability and failure model effects and critical analysis
dc.title.alternative	Apollo Lunar Surface Experiments Package Array E - Digital Data Processor reliability and failure model effects and critical analysis