Failure rate data for ALSEP

Howell, F. L.

dc.contributor.author	Howell, F. L.
dc.contributor.other	Dallaire, Rodney J.
dc.date.accessioned	2015-09-09T22:27:33Z
dc.date.available	2015-09-09T22:27:33Z
dc.date.issued	1970
dc.identifier.other	31111000669182
dc.identifier.uri	https://hdl.handle.net/20.500.11753/301
dc.description.abstract	This ATM now includes failure rate data on Unitrode and Isofilm diodes and TTL integrated circuits. Also, the integrated circuit failure rate is now a function of temperature. A lunar standby K factor has been added and minor changes have been made to all failure rate charts. Appendix A, Reliability Mathematics and Methods has also been added.
dc.description.statementofresponsibility	prepared by F. L. Howell, R. J. Dallaire.
dc.description.tableofcontents	Introduction -- Array E environment and K factors -- Array E derating criteria -- Failure modes apportionment -- Component failure rates -- Reliability mathematics and methods.
dc.format.extent	45 leaves
dc.format.mimetype	application/pdf
dc.language.iso	en
dc.publisher	Bendix Aerospace Systems Division
dc.relation.ispartofseries	ALSEP technical memorandum
dc.source.uri	https://www.lpi.usra.edu/lunar/ALSEP/pdf/31111000669182.pdf
dc.subject.lcc	TL789.8.U6A5
dc.subject.lcsh	Apollo Lunar Surface Experiments Package
dc.title	Failure rate data for ALSEP
dc.title.alternative	Failure rate data for Apollo Lunar Surface Experiments Package
dc.description.version	Revision no. A