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Failure rate data for ALSEP

Show simple item record Howell, F. L.
dc.contributor.other Dallaire, Rodney J. 2015-09-09T22:27:33Z 2015-09-09T22:27:33Z 1970
dc.identifier.other 31111000669182
dc.description.abstract This ATM now includes failure rate data on Unitrode and Isofilm diodes and TTL integrated circuits. Also, the integrated circuit failure rate is now a function of temperature. A lunar standby K factor has been added and minor changes have been made to all failure rate charts. Appendix A, Reliability Mathematics and Methods has also been added.
dc.description.statementofresponsibility prepared by F. L. Howell, R. J. Dallaire.
dc.description.tableofcontents Introduction -- Array E environment and K factors -- Array E derating criteria -- Failure modes apportionment -- Component failure rates -- Reliability mathematics and methods.
dc.format.extent 45 leaves
dc.format.mimetype application/pdf
dc.language.iso en
dc.publisher Bendix Aerospace Systems Division
dc.relation.ispartofseries ALSEP technical memorandum
dc.subject.lcc TL789.8.U6A5
dc.subject.lcsh Apollo Lunar Surface Experiments Package
dc.title Failure rate data for ALSEP
dc.title.alternative Failure rate data for Apollo Lunar Surface Experiments Package
dc.description.version Revision no. A

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    Apollo Lunar Surface Experiment Package (ALSEP) Documents

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