Parts applications analysis RSST

Moskowitz, Lee S.

dc.contributor.author	Moskowitz, Lee S.
dc.date.accessioned	2015-09-09T22:27:30Z
dc.date.available	2015-09-09T22:27:30Z
dc.date.issued	1970
dc.identifier.other	31111000668986
dc.identifier.uri	https://hdl.handle.net/20.500.11753/281
dc.description.abstract	The major change between this document and corresponding documents as released by Gulton is the basic failure rate used in this ATM for the RCA CD4000 family of COS/MOS Fets. Bendix Reliability arrived at a more realistic failure rate in view of test data received from RCA from two separate tests.
dc.description.statementofresponsibility	prepared by Lee Moskowitz.
dc.format.extent	19 leaves
dc.format.mimetype	application/pdf
dc.language.iso	en
dc.publisher	Bendix Aerospace Systems Division
dc.relation.ispartofseries	ALSEP technical memorandum
dc.source.uri	https://www.lpi.usra.edu/lunar/ALSEP/pdf/31111000668986.pdf
dc.subject.lcc	TL789.8.U6A5
dc.subject.lcsh	Apollo Lunar Surface Experiments Package
dc.subject.lcsh	Electric controllers
dc.title	Parts applications analysis RSST
dc.title.alternative	Parts applications analysis Resettable Solid State Timer