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RSST failure mode, effects, and criticality analysis

Show simple item record Moskowitz, Lee S. 2015-09-09T22:27:30Z 2015-09-09T22:27:30Z 1970
dc.identifier.other 31111000668978
dc.description.abstract The major change between this document and corresponding documents as released by Gulton is the basic failure rate used in this ATM for the RCA CD4000 family of COS/MOS Fets. Bendix Reliability arrived at a more realistic failure rate in view of test data received from RCA frdm two separate tests. The major effect that this change has upon all related documentation is that the COS/MOS counters now have the highest probability of failure of any part used in the RSST. This changes the criticality rankings of the parts covered by this document.
dc.description.statementofresponsibility prepared by Lee Moskowitz.
dc.format.extent 27 leaves
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.publisher Bendix Aerospace Systems Division
dc.relation.ispartofseries ALSEP technical memorandum
dc.subject.lcc TL789.8.U6A5
dc.subject.lcsh Electric controllers.
dc.subject.lcsh Apollo Lunar Surface Experiments Package.
dc.title RSST failure mode, effects, and criticality analysis
dc.title.alternative Resettable Solid State Timer failure mode, effects, and criticality analysis

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    Apollo Lunar Surface Experiment Package (ALSEP) Documents

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