Dual 90 channel multiplexer reliability prediction and failure mode, effects & criticality analysis

Mansour, John.

dc.contributor.author	Mansour, John.
dc.date.accessioned	2015-09-09T22:27:27Z
dc.date.available	2015-09-09T22:27:27Z
dc.date.issued	1970
dc.identifier.other	31111000668671
dc.identifier.uri	https://hdl.handle.net/20.500.11753/264
dc.description.abstract	This ATM documents the Reliability Prediction and Failure Modes and Effects analysis of the Bendix de signed Dual 90 Channel Multiplexer. The analysis reflects the final flight configuration for the A2 ALSEP system.
dc.description.statementofresponsibility	prepared by John Mansour.
dc.format.extent	18 leaves
dc.format.mimetype	application/pdf
dc.language.iso	en
dc.publisher	Bendix Aerospace Systems Division
dc.relation.ispartofseries	ALSEP technical memorandum
dc.source.uri	https://www.lpi.usra.edu/lunar/ALSEP/pdf/31111000668671.pdf
dc.subject.lcc	TL789.8.U6A5
dc.subject.lcsh	Apollo Lunar Surface Experiments Package
dc.subject.lcsh	Multiplexing
dc.subject.lcsh	Electronic apparatus and appliances--Testing
dc.title	Dual 90 channel multiplexer reliability prediction and failure mode, effects & criticality analysis