Browsing ALSEP Documents by Author "Dallaire, Rodney J."

Now showing items 1-9 of 9

ALSEP Flight System A2 system level failure mode effects and criticality analysis

Moskowitz, Lee S.; Dallaire, Rodney J. (Bendix Aerospace Systems Division, 1970)

This Failure Mode Effects and Criticality Analysis (FMECA) identifies those potential failure modes constituting single point failures or critical failures peculiar to ALSEP Flight System A2.
Array E uplink redundancy method justification

Dallaire, Rodney J.; Thomas, D. J. (Bendix Aerospace Systems Division, 1971)

This ATM provides the reliability justification for the redundancy method employed in the Array E (Apollo 17) uplink. The Array E uplink employs standby redundancy without cross-over and automatic switch-over after 61 hours ...
ASE/CE 16 ch. multiplexer -A/D converter reliability prediction and failure mode, effects & criticality analysis

Dallaire, Rodney J. (Bendix Aerospace Systems Division, 1970)

This ATM documents the Reliability Prediction and Failure Modes Effects & Criticality Analysis of the Bendix designed ASE/CE 16 CH Multiplexer A/D Converter. The analysis reflects the final flight configuration for the ...
ASE/CE 16 ch. multiplexer -A/D converter reliability prediction and failure mode, effects & criticality analysis

Dallaire, Rodney J. (Bendix Aerospace Systems Division, 1970)

This ATM documents the Reliability Prediction and Failure Modes Effects & Criticality Analysis of the Bendix designed ASE/CE 16 CH Multiplexer A/D Converter. The analysis reflects the final flight configuration for the ...
Dual A/D converter reliability prediction and failure mode, effects & criticality analysis

Dallaire, Rodney J. (Bendix Aerospace Systems Division, 1970)

This ATM documents the Reliability Prediction and Failure Modes Effects & Criticality Analysis of the Bendix designed Dual A/D Converter. The analysis reflects the final flight configuration for the Array D ALSEP System.
Failure rate data for ALSEP

Howell, F. L. (Bendix Aerospace Systems Division, 1970)

This ATM now includes failure rate data on Unitrode and Isofilm diodes and TTL integrated circuits. Also, the integrated circuit failure rate is now a function of temperature. A lunar standby K factor has been added and ...
Parts application analysis A/D Converter ALSEP Array D

Dallaire, Rodney J. (Bendix Aerospace Systems Division, 1970)

The purpose of this ATM is to document the results of the Parts Application Analysis study conducted on the A/D Converter portion of the Dual 90 Channel Multiplexer.
Parts application analysis ASE 16 channel multiplexer -A/D converter

Dallaire, Rodney J. (Bendix Aerospace Systems Division, 1970)

The purpose of this ATM is to document the results of the Parts Application Analysis study conducted on the ASE 16 Channel Multiplexer A/D Converter.
Parts application analysis dual 90 channel multiplexer ALSEP Array A-2

Dallaire, Rodney J. (Bendix Aerospace Systems Division, 1970)

The purpose of this ATM is to document the results of the parts application analysis study conducted on the Dual 90 Channel Multiplexer. This multiplexer represents the Bendix designed unit which utilizes MOS-FET integrated ...

Browsing ALSEP Documents by Author "Dallaire, Rodney J."

Browsing ALSEP Documents by Author "Dallaire, Rodney J."

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