Ion probe analysis of artificially implanted ions in terrestrial samples and surface enhanced ions in lunar sample 76215,77

dc.contributor.author	Zinner, E.
dc.contributor.author	Walker, R. M.
dc.contributor.author	Chaumont, J.
dc.contributor.author	Dran, J. C.
dc.coverage.spatial	Moon
dc.date.accessioned	2020-07-10T19:40:30Z
dc.date.available	2020-07-10T19:40:30Z
dc.date.issued	1976
dc.identifier.citation	Proc. Lunar Sci. Conf. 7th (1976), p. 953-984.	en
dc.identifier.uri	https://hdl.handle.net/20.500.11753/1626
dc.description.abstract	We used the ARL ion probe at the JSC to measure concentration depth profiles of artificially implanted ions in terrestrial minerals and of natural elements on the surface of a recently exposed lunar plagioclase crystal.	en
dc.format.extent	Pages 953-984
dc.format.mimetype	application/pdf
dc.language.iso	en	en
dc.publisher	Pergamon Press	en
dc.relation.ispartofseries	LSI contribution ; no. 253
dc.subject	Plagioclase	en
dc.subject	Lunar surface samples	en
dc.subject	Lunar petrology	en
dc.title	Ion probe analysis of artificially implanted ions in terrestrial samples and surface enhanced ions in lunar sample 76215,77	en
dc.type	Book chapter	en

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