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Ion probe analysis of artificially implanted ions in terrestrial samples and surface enhanced ions in lunar sample 76215,77

Ion probe analysis of artificially implanted ions in terrestrial samples and surface enhanced ions in lunar sample 76215,77

Zinner, E.; Walker, R. M.; Chaumont, J.; Dran, J. C.
URI: https://hdl.handle.net/20.500.11753/1626
Date: 1976

Abstract:

We used the ARL ion probe at the JSC to measure concentration depth profiles of artificially implanted ions in terrestrial minerals and of natural elements on the surface of a recently exposed lunar plagioclase crystal.

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