dc.contributor.author |
Lee, Seungyeol |
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dc.contributor.author |
https://orcid.org/0000-0002-0175-1389 |
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dc.contributor.author |
Xu, Huifang |
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dc.date.accessioned |
2020-03-31T21:31:56Z |
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dc.date.available |
2020-03-31T21:31:56Z |
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dc.date.issued |
2020-01-31 |
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dc.identifier.citation |
Lee, S.; Xu, H. Using Complementary Methods of Synchrotron Radiation Powder Diffraction and Pair Distribution Function to Refine Crystal Structures with High Quality Parameters—A Review. Minerals 2020, 10, 124. |
en |
dc.identifier.other |
https://doi.org/10.3390/min10020124 |
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dc.identifier.uri |
https://hdl.handle.net/20.500.11753/1472 |
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dc.description.abstract |
Determination of the atomic-scale structures of certain fine-grained minerals using single-crystal X-ray diffraction (XRD) has been challenging because they commonly occur as submicron and nanocrystals in the geological environment. Synchrotron powder diffraction and scattering techniques are useful complementary methods for studying this type of minerals. In this review, we discussed three example studies investigated by combined methods of synchrotron radiation XRD and pair distribution function (PDF) techniques: (1) low-temperature cristobalite; (2) kaolinite; and (3) vernadite. |
en |
dc.description.statementofresponsibility |
by Seungyeol Lee and Huifang Xu |
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dc.format.extent |
17 pages |
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dc.format.mimetype |
application/zip |
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dc.language.iso |
en |
en |
dc.publisher |
NDPI |
en |
dc.relation.ispartofseries |
LPI contribution ; no. 2344 |
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dc.subject |
Powder metallurgy--Diffraction |
en |
dc.subject |
Synchrotron radiation |
en |
dc.subject |
X-ray diffraction imaging |
en |
dc.title |
Using Complementary Methods of Synchrotron Radiation Powder Diffraction and Pair Distribution Function to Refine Crystal Structures with High Quality Parameters—A Review |
en |
dc.type |
Article |
en |
dc.rights.license |
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited |
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