Jull, A. J. Timothy; https://orcid.org/0000-0002-4079-4947; Ott, Ulrich, Prof.; Gucsik, Arnold; https://orcid.org/0000-0003-2777-0112
Abstract:
The meeting will cover fields such as microscopy (SEM, TEM, EBSD, et cetera), spectroscopy (e.g., OSL, CL, TL, ESR, Raman, et cetera), mass spectrometry, and microprobe (SIMS) methods that have been used in different samples including geological materials, minerals, meteorites, or experimentally grown crystals.