dc.contributor.author |
Howell, R. |
|
dc.date.accessioned |
2015-09-09T22:27:01Z |
|
dc.date.available |
2015-09-09T22:27:01Z |
|
dc.date.issued |
1968 |
|
dc.identifier.other |
31111000665826 |
|
dc.identifier.uri |
https://hdl.handle.net/20.500.11753/122 |
|
dc.description.abstract |
This ATM presents the results of the Thermal Mapping Test performed on the GE PCU. The test was performed between 4/9/68 and 4/11/68. |
|
dc.description.statementofresponsibility |
prepared by R. Howell. |
|
dc.format.extent |
10 leaves |
|
dc.format.mimetype |
application/pdf |
|
dc.language.iso |
en |
|
dc.publisher |
Bendix Aerospace Systems Division |
|
dc.relation.ispartofseries |
ALSEP technical memorandum |
|
dc.source.uri |
https://www.lpi.usra.edu/lunar/ALSEP/pdf/ALSEP%20%23268%20-%20Results_ThermMapTest_PowerConditionUnit_ATM%20753.pdf |
|
dc.subject.lcc |
TL789.8.U6A5 |
|
dc.subject.lcsh |
Apollo Lunar Surface Experiments Package |
|
dc.subject.lcsh |
Thermal analysis |
|
dc.subject.lcsh |
Power electronics |
|
dc.title |
Results of the thermal mapping test on the ALSEP power conditioning unit |
|